The design process of wireless systems, subsystems and components necessitates a comprehensive test strategy that includes optimization and validation.
The most productive approach that is cost efficient and will minimize the time-to-market must combine quick and easy standard-compliance tests with more thorough analysis and troubleshooting. With the latest standards pushing the limits of device bandwidth, adjacent channel and spurious performance, and complexity, selecting the correct test instruments has become essential for the current project as well as future ones.
During this free Keysight Technologies webcast, the company will outline some of the challenges that wireless device and system designers face and how this affects the signal analyzer used to test these devices. Techniques to test the limits of a device will be discussed, including how to optimize the analyzer for harmonics, intermodulation, spectrum emissions mask, spurious and adjacent channel measurements.
Additionally, the company will reveal some advanced tools for troubleshooting and design optimization. Finally, throughout the webcast, Keysight will use modern enhancements and techniques to demonstrate that a mid-range analyzer can be used for high performance wireless applications.
Wireless system, subsystem and component design and test engineers and engineering managers interested in learning techniques for testing the limits of a device, troubleshooting and design optimization should consider attending this webinar, which will be conducted on June 29th at 10:00 a.m., PT, 1:00 p.m., ET, and is entitled Meeting Measurement Challenges of Agile Complex Wireless Signals.
To attend this informative webinar, please access this direct registration link...