[SatNews] The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters.
The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.
The Agilent E5063A offers the best balance of performance and cost. It provides excellent RF performance, including trace noise of 0.002 dBrms and the stability of 0.01 dB/degC. This feature helps reduce test cost without sacrificing quality.
Using the E5063A with U1810B USB RF switch, engineers can build an economical multi-DUT test solution for testing four antennas with a single instrument, further reducing cost of test.
With proven calibration and data analysis capabilities, including the fixture simulator function, the E5063A provides measurements consistent with the industry-standard Agilent E5071C ENA Series network analyzer.
The combination of the E5063A and the 85070E dielectric probe kit offers an ideal economical solution for characterizing dielectric material, making it suitable for material researchers with limited budgets.
“The new Agilent E5063A ENA Series network analyzer addresses the need to drive down the total cost of test for both the manufacturing and R&D environments,” said Akira Nukiyama, vice president and general manager, Agilent’s Component Test Division. “It is an optimized solution without compromising performance or quality.”
U.S. Pricing and Additional Information
The Agilent E5063A ENA Series network analyzer pricing options and trade up options can be found at.