[SatNews] As defense budgets shrink amid calls for smaller, more technologically capable military forces, the push to do more with less, when it comes to test and measurement, is stronger than ever.
At the same time, the performance and reliability requirements for aerospace and defense systems will continue to become increasingly stringent. In light of these seemingly conflicting requirements, the tools for test need to adapt, addressing issues such as ease of use, cost of test and perhaps most importantly, cutting edge performance.
This free Keysight Technologies webcast on July 23rd, will explore the current trends for test and measurement equipment and software showing how new architectures and capabilities are needed to help solve the quickly escalating characterization challenges of various application areas like electronic warfare (EW) systems, Active Electronically Steerable Antennas (AESA) and military communications.
Test engineers, systems engineers, and managers who develop, test and characterize products within the aerospace and defense industry are all invited to attend this info-packed webinar.
John Hansen of Agilent Technologies.
The presenter is John Hansen, Solution Planning Engineer, at Keysight Technologies. He has more than 30 years of experience in system engineering and new product development within the wireless, microelectronics and defense industries, participating in such programs as the F-15 radar, the Trident II missile guidance system and the reactor monitoring set for the Seawolf submarine.
At Keysight, he has been responsible for the launch of microwave and mmWave signal generation products and is currently developing test and measurement solutions for radar and electronic warfare applications.
John received his BS in Engineering from UCLA, an MSEE in Communications Systems from USC, and his MBA in Finance from San Diego State University. He is also a registered Professional Engineer in the State of California.
Learn more, and to register, please visit http://www.keysight.com/main/eventDetail.jspx?cc=US&lc=eng&ckey=2568012&nid=-34878.0.00&id=2568012.